Microscopic examination on cytological changes in Allium cepa and shift in phytoplankton population at different doses of AtrazineGHOSH, Nabarun; FINGER, Kristen; USNICK, Samantha et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7729, issn 0277-786X, isbn 0-8194-8217-X 978-0-8194-8217-4, 1Vol, 77291W.1-77291W.14Conference Paper

The Bayesian approach to reporting GSR analysis results: some first-hand experiencesCHARLES, Sebastien; NYS, Bart.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7729, issn 0277-786X, isbn 0-8194-8217-X 978-0-8194-8217-4, 1Vol, 77291B.1-77291B.15Conference Paper

Scanning force microscope using Point diffraction interferometerMOUXU DONG; YOU YIFENG; ZHUO YONGMO et al.SPIE proceedings series. 1998, pp 482-487, isbn 0-8194-2777-2Conference Paper

Scanning microsensors for nanotechnologySTEDMAN, M.Sensors and actuators. A, Physical. 1993, Vol 37-38, pp 11-15, issn 0924-4247Conference Paper

Application of a scanning photon microscope to non-destructive detection of resistivity striations in a silicon waferKINAMERI, K; MUNAKATA, C; ABE, T et al.Measurement science & technology (Print). 1990, Vol 1, Num 7, pp 621-623, issn 0957-0233Article

Opto-mechanical analysis for confocal laser scanning microscopesCHANG, Gao-Wei; TWU, Ming-Jenq; LIN, Yu-Hsuan et al.SPIE proceedings series. 2005, pp 587710.1-587710.9, isbn 0-8194-5882-1, 1VolConference Paper

A scanning confocal microscope for transmission and reflection imagingDIXON, A. E; DAMASKINOS, S; ATKINSON, M. R et al.Nature (London). 1991, Vol 351, Num 6327, pp 551-553, issn 0028-0836, 3 p.Article

A versatile scanning tunnelling microscope for use in airSTEER, W. S; HOFFMANN-MILLACK, B; ROBERTS, C. J et al.Measurement science & technology (Print). 1990, Vol 1, Num 9, pp 881-886, issn 0957-0233Article

Dynamic observation of Si(111) surface using a fast scanning tunneling microscopeHOSAKA, S; HASEGAWA, T; HOSOKI, S et al.Applied physics letters. 1990, Vol 57, Num 2, pp 138-140, issn 0003-6951Article

Scanning Electron Microscopy in characterizing seeds of some Leguminous treesGHOSH, Nabarun; CHATTERJEE, Amiyangshu; SMITH, Don W et al.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 73781I.1-7378I.14Conference Paper

Magnetically controlled coarse approach device for STMHE JIAN; WANG LANPING; CHANG YUE et al.Measurement science & technology (Print). 1990, Vol 1, Num 10, pp 1116-1118, issn 0957-0233Article

Resolution enhancement in three-dimensional confocal microscopyHEWLETT, S. J; WILSON, T.Machine vision and applications. 1991, Vol 4, Num 4, pp 233-242, issn 0932-8092Article

Scanning Methods Applied to Bitemark AnalysisBUSH, Peter J; BUSH, Mary A.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7729, issn 0277-786X, isbn 0-8194-8217-X 978-0-8194-8217-4, 1Vol, 772915.1-772915.8Conference Paper

Intrinsic detection of scattering phase with near-field scanning optical microscopeKOHLGRAF-OWENS, Dana C; HAEFNER, David; SUKHOV, Sergey et al.Optics letters. 2010, Vol 35, Num 14, pp 2463-2465, issn 0146-9592, 3 p.Article

Quality and utilization of food co-products and residuesCOOKE, P; BAO, G; BRODERICK, C et al.Proceedings of SPIE, the International Society for Optical Engineering. 2010, Vol 7729, issn 0277-786X, isbn 0-8194-8217-X 978-0-8194-8217-4, 1Vol, 77291U.1-77291U.11Conference Paper

Modification of hydrogen-passivated silicon by a scanning tunneling microscope operating in airDAGATA, J. A; SCHNEIR, J; HARARY, H. H et al.Applied physics letters. 1990, Vol 56, Num 20, pp 2001-2003, issn 0003-6951Article

Resolution of scanning acoustic microscope in sub-surface imagingOHNO, M.Japanese journal of applied physics. 1988, Vol 27, Num 5, pp 734-737, issn 0021-4922, 1Article

Analysis of pn-junction degeneration in heating process for extended wavelength InGaAs detectorsZHU, Yao-Ming; DENG, Hong-Hai; WEI PENG et al.Proceedings of SPIE, the International Society for Optical Engineering. 2011, Vol 8193, issn 0277-786X, isbn 978-0-8194-8834-3, 81933D.1-81933D.8, 2Conference Paper

Scanning tunneling microscope observations of the Coulomb blockadeRONG, Z. Y; COHEN, L. F; WOLF, E. L et al.Physics letters. A. 1990, Vol 146, Num 5, pp 281-285, issn 0375-9601Article

Voltage-dependent scanning tunneling microscopy images of liquid crystals on graphiteMIZUTANI, W; SHIGENO, M; ONO, M et al.Applied physics letters. 1990, Vol 56, Num 20, pp 1974-1976, issn 0003-6951Article

Investigation into Sources of Random Uncertainties in the NanoScan-3Di Metrological Scanning Probe MicroscopeGOGOLINSKII, K. V; GUBSKII, K. L; KUZNETSOV, A. P et al.Nanotechnologies in Russia (Print). 2013, Vol 8, Num 5-6, pp 337-341, issn 1995-0780, 5 p.Article

Three-dimensional in vivo scanning microscopy with inertia-free focus controlMASCHIO, Marco Dal; STASI, Angela Michela De; BENFENATI, Fabio et al.Optics letters. 2011, Vol 36, Num 17, pp 3503-3505, issn 0146-9592, 3 p.Article

On the relationship between hidden Markov Models and convex functional transforms for simulating Scanning Probe MicroscopyADENLE, Omolabake A; FITZGERALD, William J.Proceedings of SPIE, the International Society for Optical Engineering. 2009, Vol 7378, issn 0277-786X, isbn 978-0-8194-7654-8 0-8194-7654-4, 1Vol, 737814.1-737814.8Conference Paper

Assessment of fluorochromes for two-photon laser scanning microscopy of biofilmsNEU, Thomas R; KUHLICKE, Ute; LAWRENCE, John R et al.Applied and environmental microbiology (Print). 2002, Vol 68, Num 2, pp 901-909, issn 0099-2240, 9 p.Article

Combined shear force and near-field scanning optical microscopyBETZIG, E; FINN, P. L; WEINER, J. S et al.Applied physics letters. 1992, Vol 60, Num 20, pp 2484-2486, issn 0003-6951Article